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News

 

March 2016

Xiaoliang wins the best student paper at the Image Sensor and Imaging System conference at the track of IS&T International Symposium on Electronic Imaging 2016. At the conference, she presented a paper entitled “A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique”.

 

October 2014

At the Semicon Europa conference in Grenoble, Albert Theuwissen received European SEMI Award 2014. The Award recognizes Theuwissen’s outstanding contribution to the continuing education of engineers in the field of solid-state imaging and digital cameras. He has taught and trained over 3,000 engineers at image sensor companies (such as Kodak, Sony, Samsung, Aptina, ST Microelectronics, Micron, Intel, Philips, Canon, DALSA, and Panasonic) and consumer product companies (such as Nokia, Sony-Ericsson, Motorola, Siemens, Research InMotion, Thomson, and many others). In addition, he has conducted short courses at IEEE’s IEDM, ISSCC, ICIP and SPIE’s Electronic Imaging Conference. (read more)